Conferences

Sizes of Nanostructured Elements in Granular Conductor–Dielectric Composite Films Determined by Calculation and Atomic Force Microscopy

B.Rud,
  

I. M. Frantsevich Institute for Problems of Materials Science of the NAS of Ukraine, Krzhizhanovsky str., 3, Kyiv, 03142, Ukraine
Powder Metallurgy - Kiev: Frantsevich Institute for Problems of Materials Science NASU, 2015, #01/02
http://www.materials.kiev.ua/article/1885

Abstract

Granular composite films based on ВаВ6–LaB6, Sn0,9Sb0,1O2, and alumina borosilicate glass produced by screen printing followed by heat treatment are studied. To determine the thicknesses of nanosize dielectric interlayers between conducting material particles, predetermining the conductivity mechanism and film properties, a novel calculation method is used. To evaluate the reliability of the results, film structures are studied by atomic force microscopy. The calculated data are in good agreement with the experiment. The method may be used in examining the structure and properties of new conductor–dielectric composites.


ATOMIC FORCE MICROSCOPY, CALCULATION, CONDUCTING PHASE, DIELECTRIC INTERLAYER, FILMS