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  4. № 17 2015
  5. P. 41

Indexes supplementing data of a quantitative metallography for materials physical characteristics analysis

A.Khomenko,
 
O.Khomenko,
 
G.Bagliuk
 

I. M. Frantsevich Institute for Problems of Materials Science of the NAS of Ukraine, Omeliana Pritsaka str.,3, Kyiv, 03142, Ukraine
Mathematical Models and Computing Experiment in Material Science - Kiev: Frantsevich Institute for Problems of Materials Science NASU, 2015, #17
http://www.materials.kiev.ua/article/1487

Abstract

A quantitative indexes of the material microstructure quality that expand quantitative metallography data. Analysing microstructure of Cu — 30% (wt.) Cr composite material of electrotechnical application it was established that there exists dependences between the microstructure regularity index and bending strength and between microstructure regularity index, normalized to the average particle size, and specific electrical resistance.


BEND STRENGTH, FRACTAL DIMENSION, MICROSTRUCTURE, MICROSTRUCTURE QUANTITATIVE INDICATORS, RESISTIVITY

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