STRUCTURAL AND ELECTRICAL PROPERTIES OF MAGNESIUM-DOPED CoFe2O4

D. Mohanty 1,
 
A.U.Naik 1,
 
P.K.Nayak 1,
 
Banarji Behera 2,
 
S.K.Satpathy 1*
 

1 Centurion University of Technology and Management, Odisha, 768019, India
2 Materials Research Laboratory, School of Physics, Sambalpur University, JyotiVihar, Burla, Odisha, 768019, India
santosh.satpathy@cutm.ac.in

Powder Metallurgy - Kiev: Frantsevich Institute for Problems of Materials Science NASU, 2020, #09/10
http://www.materials.kiev.ua/article/3128

Abstract

In this paper, magnesium-doped CoFe2O4 (Co0.5Mg0.5Fe2O4) compound was synthesized by a solid-state reaction route. The impact of Mg inclusion on the structural parameters of the obtained compound and the subsequent development of thermally-assisted electro-active areas has been systematically examined, as this compound has a fit composition for doping at the site of Co due to its relevantly equal atomic radius. Also, Mg was established as highly ferroelectric and low-weight material. The compound structure and microstructure have been analyzed using the method of scanning electron microscopy (SEM) and X-ray diffraction (XRD) analysis. The dielectric properties were studied over a broad spectrum of frequency and temperature, and quite low dielectric loss was recorded. In the context of impedance and conductivity formalism, frequency-dependent electrical information has been evaluated at varying temperatures. The Nyquist plot represents the effect of grain and grain boundary. Thermally activated non-Debye type relaxation processes were observed in the composites. Jonscher universal power law follows the frequency-dependent AC conductivity at different temperatures. Temperature dependence of AC conductivity at various frequencies indicates a negative temperature coefficient of resistance (NTCR) behavior. Estimating the magnitudes of activation energies in different temperature ranges enables defining the nature of the species involved in the conduction system.


ACTIVATION ENERGY, DIELECTRIC CONSTANT, NYQUIST PLOT, SCANNING ELECTRON MICROSCOPY, XRD